The JTAG Test and Configuration solution from Intellitech Corporation is a state-of-the-art system designed to streamline and enhance boundary scan testing in printed circuit boards (PCBs). Core to this solution is the support for IEEE 1149 standards, including 1149.1, 1149.6, and 1149.10, which facilitates robust interconnect testing and in-system programming. By utilizing the Eclipse Test Development Environment, this solution empowers engineers to perform schematic-based debugging, reducing prototype and development time significantly. The integration of these tests with Intellitech's Scan Executive platform allows for efficient testing and programming of flash memory, enabling thorough diagnostics and ensuring greater fault coverage, meeting the demands of complex PCB designs.
