The Scan Ring Linker (SRL) serves as a fully-embeddable solution designed to streamline JTAG test infrastructure, significantly easing the design complexities and reducing the associated costs of implementing multiple scan rings within a single system. This IP module effectively transforms diverse scan paths into a unified high-speed test bus, enabling seamless access and configuration of components on secondary chains without cumbersome hardware redesigns.
Especially beneficial for designs involving numerous interconnected scan rings, the SRL enables broad testing and configuration possibilities by linking all secondary paths to a central management bus. In doing so, engineers can independently test and configure each connected element through a singular 1149.1 interface, effectively consolidating test procedures and simplifying the design workflow.
Moreover, the SRL reduces manufacturing and operational costs by cutting down the need for multiple configuration PROMs and voltage translators in multi-scan chain designs. By this, it not only aids in efficient product testing but also aligns with stringent standards for effective and rapid device configuration and testing in modern electronic manufacturing environments.
