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SystemBIST represents a comprehensive plug-and-play device enhancing FPGA configurations and embedded JTAG testing methodologies on PCBs. This sophisticated module allows for seamless FPGA device programming and reconfiguration in-field, supporting IEEE 1532 and IEEE 1149.1 standards. Designed with a vendor-independent approach, SystemBIST offers scalable configurations for both flash memory and CPLD devices, integrating built-in self-tests (BIST) that utilize stored test patterns in flash memory. This product simplifies the traditional complex methods of FPGA configuration, removing the need for large PROM parts and streamlining production concerns with its cost-effective design, widening its appeal across sectors needing flexible, reliable re-programmable solutions.
Intellitech's Fast Access Controller (FAC) is a high-speed, pre-engineered solution tailored for enhancing design-for-test processes, particularly in environments requiring extensive flash programming through FPGA interconnections. The FAC leverages the JTAG standard to offer swift and efficient programming capabilities directly via the 1149.1 bus, reducing overall system programming time and supporting seamless integration with existing computing infrastructure. This controller is engineered for applications demanding quick microcontroller, DSP, or CPU programming in both research and commercial landscapes, facilitating improved design quality and reducing deployment cycles.
The Scan Ring Linker (SRL) by Intellitech is an essential IP module developed to reduce complexities and costs associated with multi-scan ring 1149.1 (JTAG) infrastructure in PCBs. The SRL effectively consolidates multiple scan paths into a single, high-speed test bus, streamlining operations by allowing independent testing and configuration through a unified JTAG interface. This enables more efficient diagnostics and test management across various devices on secondary scan chains, inviting notably lowered implementation costs and enhanced application reliability for engineers seeking robust PCB testing solutions.
The JTAG Test and Configuration solution from Intellitech Corporation is a state-of-the-art system designed to streamline and enhance boundary scan testing in printed circuit boards (PCBs). Core to this solution is the support for IEEE 1149 standards, including 1149.1, 1149.6, and 1149.10, which facilitates robust interconnect testing and in-system programming. By utilizing the Eclipse Test Development Environment, this solution empowers engineers to perform schematic-based debugging, reducing prototype and development time significantly. The integration of these tests with Intellitech's Scan Executive platform allows for efficient testing and programming of flash memory, enabling thorough diagnostics and ensuring greater fault coverage, meeting the demands of complex PCB designs.
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